Applications:
- Wafer inspection - Wafer presenters are used to hold and rotate wafers during inspection, allowing for automated and consistent macro analysis of wafer surfaces and features. Commonly seen in raw wafer production, post-epitaxial inspection, glass wafer haze, scratch, macro defect inspection, and lot process integrity inspections in Photolithography (photoresist) and Probe/Test areas (inking).
- Scratch reduction - Scratches on wafers can occur during handling and can result in defects and yield loss. Wafer presenters are designed to lift the wafer up from its cassette, allowing operators to access and handle the wafer without having to physically go between the wafers inside the cassette. This eliminates the need for operators to manually manipulate the wafer and reduces the risk of damage or contamination.
The P4-301 is a manual single wafer presenter, designed for 76 mm (3”) diameter wafers. The WHS-P4 fully lifts a single wafer above a cassette and presents to an operator for easy removal without scratching neighboring wafers. Constructed with antistatic materials, the WHS-P4 is built to meet the strict ISO 4 standards, ensuring the highest level of protection for your wafers.
Our presenters only work with SEMI standards wafers:
- 3” 330-400 um
- 4” 300-400 um
- 6” 645 um
- 8” 725 um
Not SEMI standards wafers please contact us for custom solutions.
